Instruments
Atomic force microscopy
Our laboratory develop and produce scientific instruments and accessories for the field of scanning probe microscopy. Our experts has more then ten years of experience in this area. We offer multifunctional atomic force microscope (AFM) with set of custom options. Specific AFM-based equipment can be developed according to the customer needs.
Download the AFM specification (~200Kb, pdf).
Quotations are available by the e-mail inquiry.
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